Ultra-Fast Digital Beam Scanning for Super-Resolution Microscopy
Bildgebung und Mikroskopie
Ref.-Nr.: 0105-5505-1-FG
Background
Modern laser scanning microscopy requires increasingly faster beam steering while maintaining nanometer-level positioning accuracy. Existing galvanometer-based scanners are limited by mechanical inertia, whereas analog electro-optical deflectors offer high speed but only over limited scan ranges and require complex analog control.
The presented technology introduces a digital beam steering/scanning architecture that combines multiple polarization-controlled electro-optical deflectors to achieve discrete, deterministic beam positioning with greatly expanded scan fields and excellent optical stability.
Technology
The technology employs cascaded digital electro-optical deflection stages in which the polarization state of the laser beam determines discrete angular deflection. Multiple deflection stages with progressively increasing angular increments create a hierarchical beam steering system capable of addressing a large number of scan positions.
Important technical features:
- Cascaded digital electro-optical deflectors
- Polarization-controlled beam steering
- Tilting of the beam around a fixed point within the microscope objective pupil
- Achromatic polarization optics for multi-wavelength operation
- Optional analog fine-steering stage for continuous positioning
- Efficient descanning of fluorescence emission independent of polarization
- Optimized digital scan sequences (e.g., Gray-code addressing) to reduce switching frequency and photobleaching.
Advantages
- Ultra-fast electro-optical switching
- Excellent positioning reproducibility
- Reduced mechanical wear
- Lower vibration sensitivity
- Achromatic optical design
- Hybrid digital–analog positioning capability
- Reduced photobleaching through optimized scan trajectories
- Suitable for demanding super-resolution imaging applications
- Easily scalable by adding additional digital deflection stages.
Potential Applications
- STED microscopy
- MINFLUX microscopy
- Confocal microscopy
- Live-cell imaging
- Fluorescence imaging
Patent Information
- DE602018053753T2
- EP3724707B1 (validated in DE, FR and GB)
- US11513327B2
PDF Download
- Ref.-Nr.: 0105-5505-1-FG (619,5 KiB)
Kontaktperson
Patent- & Lizenzmanager
Dr. Franz Gadelmeier
Diplom-Physiker
+49 171 656 9140
gadelmeier@max-planck-innovation.de
